Yokogawa AQ6375E-20-L1-F Optical Spectrum Analyzer
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Yokogawa AQ6375E-20-L1-F Optical Spectrum Analyzer
Available to Ship Immediately
€86,666.67

Extended wavelength optical spectrum analyzer designed for precision SWIR optical measurement and photonic device characterization from 1000 nm to 2500 nm.



DESCRIPTION:

The Yokogawa AQ6375E-20-L1-F is a high-performance long-wavelength optical spectrum analyzer designed for precision optical characterization and photonic device analysis across the extended 1000 nm to 2500 nm wavelength range. The instrument is engineered for laboratory, R&D, spectroscopy, environmental sensing, industrial laser development, medical photonics, and telecommunications applications requiring high-resolution SWIR optical analysis capability.

The AQ6375E-20 extended wavelength configuration supports optical measurement beyond conventional telecom wavelength regions into the 2 µm band used for environmental gas sensing, laser absorption spectroscopy, industrial processing, and advanced photonics research. The analyzer utilises a high-precision double-pass Czerny-Turner monochromator architecture delivering wavelength resolution down to 0.05 nm together with close-in dynamic range performance up to 55 dB.

The instrument supports optical power measurement from +20 dBm down to -70 dBm using high-dynamic-range optical detection circuitry suitable for both high-power and low-power optical source characterization. Integrated wavelength calibration and reference source functionality are provided through the L1 wavelength reference source configuration for improved long-term wavelength accuracy and measurement repeatability.

The AQ6375E incorporates free-space optical input architecture supporting both single-mode and multimode fibre measurement environments while reducing connector wear and maintenance requirements. Integrated gas purge ports reduce water vapour absorption effects during upper near-IR measurements, while the built-in cut filter suppresses higher-order diffracted light for improved spectral accuracy during long-wavelength optical characterization.

Advanced sweep and analysis functionality includes Double Speed Mode operation, automatic wavelength calibration, high-speed remote interface capability, and Advanced Pulsed Light Measurement (APLM) mode for pulsed infrared optical signal analysis. Ethernet, GP-IB, and RS-232 communication interfaces support automated laboratory and production system integration.

Key Features

  • Extended wavelength optical spectrum analyzer
  • Wavelength range from 1000 nm to 2500 nm
  • Wavelength resolution down to 0.05 nm
  • Optical sensitivity down to -70 dBm
  • Optical input power up to +20 dBm
  • Close-in dynamic range up to 55 dB
  • Double-pass Czerny-Turner monochromator architecture
  • Integrated L1 wavelength reference source
  • Built-in gas purge ports
  • Higher-order diffraction suppression filter
  • Advanced Pulsed Light Measurement (APLM) mode
  • Double Speed Mode sweep operation
  • Automatic wavelength calibration functionality
  • Free-space optical input architecture
  • Supports single-mode and multimode fibre measurements
  • Ethernet, GP-IB, and RS-232 remote control support
  • Suitable for spectroscopy and gas sensing applications
  • Designed for photonics R&D and optical manufacturing environments
  • Bench-top laboratory optical analyzer platform




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