DESCRIPTION:

The Yokogawa AQ6375B INNO is a high-performance long-wavelength optical spectrum analyzer designed for precision optical measurement and photonic device characterization across the 1200 nm to 2400 nm wavelength range. The instrument is engineered for laboratory, R&D, photonics manufacturing, environmental sensing, spectroscopy, telecommunications, and industrial laser applications requiring high-resolution SWIR optical analysis capability.

The AQ6375B utilises a grating-based double-pass monochromator architecture providing wavelength resolution down to 0.05 nm together with close-in dynamic range performance to 55 dB. Measurement sensitivity extends down to -70 dBm with optical power measurement capability up to +20 dBm, enabling accurate analysis of both low-power and high-power optical sources.

Designed for advanced long-wavelength optical analysis, the AQ6375B incorporates integrated gas purging ports to minimise water vapour absorption effects during upper near-IR measurements. A built-in cut filter reduces higher-order diffracted light effects for improved spectral accuracy during long-wavelength optical characterization and gas spectroscopy applications.

The instrument supports high-speed optical sweep operation with sweep times from 0.5 seconds per 100 nm span together with a dedicated Double Speed Mode providing up to 2x faster acquisition performance compared to standard sweep operation. Fast automatic wavelength calibration and optical alignment are provided using the integrated reference light source system.

The AQ6375B supports both single-mode and multimode fibre measurement environments using free-space optical input architecture for improved connector reliability and reduced maintenance requirements. Remote control capability is supported through Ethernet, GP-IB, and RS-232 communication interfaces for automated laboratory and production system integration.

Key Features

• Long-wavelength optical spectrum analyzer
• Wavelength range from 1200 nm to 2400 nm
• Resolution down to 0.05 nm
• Optical sensitivity down to -70 dBm
• Optical power measurement up to +20 dBm
• Close-in dynamic range up to 55 dB
• Double-pass monochromator architecture
• Integrated gas purge ports for water vapour reduction
• Built-in cut filter for higher-order diffraction suppression
• Double Speed Mode for accelerated sweep operation
• Sweep times from 0.5 seconds per 100 nm span
• Automatic wavelength calibration functionality
• Free-space optical input architecture
• Supports single-mode and multimode fibre measurements
• Ethernet, GP-IB, and RS-232 remote control support
• Suitable for spectroscopy and gas sensing applications
• Designed for photonics R&D and optical manufacturing environments
• Bench-top laboratory optical analyzer platform