DESCRIPTION:

The Yokogawa AQ6375B-01 is a high-performance optical spectrum analyzer designed for precision long-wavelength optical measurement and photonic device characterization across the 1200 nm to 2400 nm wavelength range. The instrument is engineered for laboratory, R&D, spectroscopy, photonics manufacturing, environmental sensing, telecommunications, and industrial laser applications requiring high-resolution SWIR optical analysis capability.

The AQ6375B-01 utilises a grating-based double-pass monochromator architecture providing wavelength resolution down to 0.05 nm together with close-in dynamic range performance up to 55 dB. Optical sensitivity extends down to -70 dBm with maximum measurable optical input levels up to +20 dBm, supporting accurate analysis of low-power and high-power optical sources across demanding photonic measurement environments.

Designed for advanced long-wavelength optical characterization, the analyzer incorporates integrated gas purge ports to minimise water vapour absorption effects during upper near-IR measurements. A built-in cut filter suppresses higher-order diffraction effects for improved spectral accuracy during long-wavelength optical characterization and gas spectroscopy applications.

The AQ6375B-01 supports high-speed sweep operation with sweep times from 0.5 seconds per 100 nm span together with dedicated Double Speed Mode operation for accelerated acquisition performance. Automatic wavelength calibration and optical alignment functionality are provided through the integrated reference light source system.

The free-space optical input architecture supports both single-mode and multimode fibre measurement environments while reducing connector wear and maintenance requirements. Remote operation and automated test integration are supported through Ethernet, GP-IB, and RS-232 communication interfaces for laboratory automation and production test environments.

Key Features

• Long-wavelength optical spectrum analyzer
• Wavelength range from 1200 nm to 2400 nm
• Resolution down to 0.05 nm
• Optical sensitivity down to -70 dBm
• Optical power measurement up to +20 dBm
• Close-in dynamic range up to 55 dB
• Double-pass monochromator architecture
• Integrated gas purge ports
• Built-in higher-order diffraction suppression filter
• Double Speed Mode sweep operation
• Sweep times from 0.5 seconds per 100 nm span
• Automatic wavelength calibration functionality
• Free-space optical input architecture
• Supports single-mode and multimode fibre measurements
• Ethernet, GP-IB, and RS-232 remote control support
• Suitable for spectroscopy and gas sensing applications
• Designed for photonics R&D and optical manufacturing environments
• Bench-top laboratory optical analyzer platform