FLIR X6980-HS SLS™ High-Speed LWIR Science-Grade Camera Series
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FLIR X6980-HS SLS™ High-Speed LWIR Science-Grade Camera Series
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Ultra-high-speed LWIR scientific thermal imaging camera series featuring cooled Strained Layer Superlattice (SLS) detector technology, 640 × 512 resolution, full-frame acquisition rates up to 1004 Hz, and advanced radiometric measurement capabilities for research, aerospace, defence, electronics, battery testing, and materials science applications.



DESCRIPTION:

The FLIR X6980-HS SLS™ Series is FLIR's flagship high-speed long-wave infrared (LWIR) scientific camera platform, designed for researchers and engineers requiring exceptional thermal imaging performance when analysing extremely fast thermal events. Built around a cooled Strained Layer Superlattice (SLS) detector, the camera combines the sensitivity advantages of LWIR imaging with industry-leading acquisition speeds and radiometric measurement capability.

Unlike MWIR InSb models optimized for hotter targets, the X6980-HS SLS platform excels in capturing thermal signatures of ambient-temperature and lower-temperature objects. This makes the series particularly valuable for battery testing, electronics diagnostics, materials science, composites inspection, solar cell analysis, thermal transient investigations, and failure analysis applications where subtle temperature variations must be measured with high precision.

The camera delivers full-frame 640 × 512 thermal imagery at up to 1004 Hz while supporting flexible sub-windowing modes that enable significantly higher acquisition rates for specialized high-speed testing. Advanced synchronization, triggering, and timestamping capabilities allow seamless integration into laboratory test rigs, aerospace qualification programs, defence research environments, and automated scientific measurement systems.

The X6980-HS SLS incorporates high-speed 10 GigE, CoaXPress, and Camera Link interfaces together with onboard RAM and SSD recording capabilities, ensuring reliable capture of critical thermal events without dropped frames. Compatibility with FLIR Research Studio and ResearchIR software provides a complete thermal acquisition, analysis, and reporting platform for demanding R&D environments.

Technical Specifications

  • Series: X6980-HS SLS™
  • Detector type: Cooled Strained Layer Superlattice (SLS)
  • Thermal resolution: 640 × 512 pixels
  • Pixel pitch: 25 µm
  • Spectral range: 7.5 µm to 12.5 µm
  • Dynamic range: 14-bit
  • Full-frame acquisition rate: Up to 1004 Hz
  • Programmable frame rates: 0.0015 Hz to 1004 Hz
  • Thermal sensitivity (NETD): 40 mK typical
  • Integration time: Programmable from 270 ns
  • Closed-cycle rotary cooling
  • Four-position motorized filter wheel
  • Motorized focus support
  • 10 GigE interface
  • CoaXPress interface
  • Camera Link Full interface
  • HDMI and SDI video outputs
  • IRIG-B time synchronization
  • On-camera RAM recording
  • Removable SSD recording
  • Standard temperature range: -20°C to 350°C
  • Optional temperature ranges up to 3000°C available
  • Research Studio and ResearchIR compatible software support

Available Variations

The X6980-HS SLS platform is available in multiple configurations including:

  • X6981-HS SLS (f/2.5 configuration)
  • X6983-HS SLS (f/4.1 configuration)
  • Manual lens configurations
  • Motorized lens configurations
  • Research-grade radiometric packages
  • High-speed streaming configurations
  • SSD recording configurations
  • Custom optical filter configurations

Key Features

  • Cooled SLS detector technology
  • LWIR spectral response (7.5 µm to 12.5 µm)
  • 640 × 512 thermal resolution
  • Up to 1004 Hz full-frame capture
  • High-speed sub-window acquisition
  • Scientific-grade radiometric measurements
  • 14-bit dynamic range
  • Exceptional performance on ambient-temperature targets
  • Four-position motorized filter wheel
  • 10 GigE high-speed streaming
  • CoaXPress connectivity
  • Camera Link Full support
  • Onboard RAM and SSD recording
  • Advanced triggering and synchronization
  • IRIG-B time-stamping capability
  • Compatible with FLIR Research software
  • Suitable for battery testing
  • Suitable for electronics diagnostics
  • Suitable for materials science research
  • Suitable for aerospace and defence testing
  • Suitable for thermal transient analysis and failure investigations




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